Nanoscale Infrared Microscopy with sub 10 nm Spatial Resolution


报告题目: Nanoscale Infrared Microscopy with sub 10 nm Spatial Resolution

报告人:Dr. Xiaoji Xu,Lehigh University, USA




While Abbe’s optical diffraction limit prevents nanometer-scale spatial resolution for conventional microscopy and spectroscopy, the combination of optics and scanning probe microscopy provides a way to bypass the diffraction limit. One type of imaging technique is to utilize the near-field light scattering from a metallic AFM tip to locally probe the optical properties of the sample. The other type of high spatial resolution imaging technique is to measure the light-induced thermal expansions in the sample and related that to the local optical or infrared absorption. In the presentation, I will first describe our recent development of the scattering-type infrared near-field microscopy for three-dimensional mapping of near-field responses and a route to incorporate scattering-type infrared near-field microscopy with ultrafast lasers.1-2 Then, I will present our latest invention of peak force infrared (PFIR) microscopy3 that provides infrared imaging, broadband spectroscopy, and mechanical property mapping at a spatial resolution as high as 6 nm. In the end, I will describe applications of PFIR microscopy on the characterization of urban aerosols (particulate matter PM2.5)4 as well as the characterization of biological samples. The exploration of nanoscale phenomena will be facilitated by these nanoscale infrared imaging techniques in revealing hidden secrets of the nanoworld.

1.     Wang, L.; Xu, X. G., Scattering-type scanning near-field optical microscopy with reconstruction of vertical interaction. Nature Communications 2015, 6, 8973.
2.     Wang, H.; Wang, L.; Xu, X. G., Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling. Nature Communications 2016, 7, 13212.
3.     Wang, L.; Wang, H.; Wagner, M.; Yan, Y.; Jakob, D. S.; Xu, X. G., Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy. Science Advances 2017, 3 (6), e1700255.
4.     Wang, L.; Huang, D.; Chan, C. K.; Li, Y. J.; Xu, X. G., Nanoscale spectroscopic and mechanical characterization of individual aerosol particles using peak force infrared microscopy. Chem Commun 2017, 53 (53), 7397-7400.