[Small methods] 我室洪文晶教授发表论文:The Characterization of Electronic Noise in the Charge Transport through Single‐Molecule Junctions

发布日期:2021年01月29日   浏览次数:

我室洪文晶教授在 Small methods 上发表论文:The Characterization of Electronic Noise in the Charge Transport through Single‐Molecule Junctions

文章链接:https://onlinelibrary.wiley.com/doi/10.1002/smtd.202001064

摘要:With the goal of creating single‐molecule devices and integrating them into circuits, the emergence of single‐molecule electronics provides various techniques for the fabrication of single‐molecule junctions and the investigation of charge transport through such junctions. Among the techniques for characterization of charge transport through molecular junctions, electronic noise characterization is an effective strategy with which issues from molecule–electrode interfaces, mechanisms of charge transport, and changes in junction configurations are studied. Electronic noise analysis in single‐molecule junctions can be used to identify molecular conformations and even monitor reaction kinetics. This review summarizes the various types of electronic noise that have been characterized during single‐molecule electrical detection, including the functions of random telegraph signal (RTS) noise, flicker noise, shot noise, and their corresponding applications, which provide some guidelines for the future application of these techniques to problems of charge transport through single‐molecule junctions.